Interconnect structure using a Al2 Cu for an integrated circuit chip

ABSTRACT

An interconnect structure and method for an integrated circuit chip for resisting electromigration is described incorporating patterned interconnect layers of Al or Al-Cu and interlayer contact regions or studs of Al 2  Cu between patterned interconnect layers. The invention overcomes the problem of electromigration at high current density in the interconnect structure by providing a continuous path for Cu and/or Al atoms to move in the interconnect structure.

FIELD OF THE INVENTION

This invention relates to multilevel metal interconnections on anintegrated circuit chip and more particularly to vias, studs, or riserwires between conductors of respective levels of metal interconnectionswith reduced electromigration failures.

BACKGROUND OF THE INVENTION

The current metalization used in multilevel metal interconnections bysome manufacturers include aluminum-copper lines for each level ofmetalization and tungsten vias or studs between conductors of respectivelevels of metal interconnections. The use of Cu solute additions to Alis desirable because it reduces the rate of electromigration andstress-voiding. The amount of Cu addition Al, however, is limited by theability to reactive ion etch the Al(Cu) line to ≦2 wt. % Cu. Thetungsten studs act as a complete barrier to copper and aluminum atomswhich may be moved or transported at high current densities in theconductors, resulting in copper and/or aluminum depletion adjacent totungsten studs which, in turn leads to electromigration open failures.To avoid electromigration open failures, a set of downstream groundrules for electrical current is required to limit the current densitiesin the conductors. The ground rules, however, limit the performance ofadvanced complementary metal oxide semiconductor (CMOS) logic chips. Onesolution to this problem is to replace the tungsten stud or via withaluminum, or some other low resistivity material through which aluminumor copper can diffuse or be transported. The main difficulties with analuminum stud are finding a technique which can be used to fill highaspect ratio holes with aluminum to form the studs or vias. A number ofmethods have been investigated, such as chemical vapor deposition (CVD),electron cyclotron resonance (ECR), columnated sputtering, hotsputtering and various electro deposition techniques. With the foregoingmethods, however, there are subsequent integration, throughput orthermal budget problems.

Another option is to use copper studs or vias. Filling of extremely highaspect ratio holes, greater than 3, has been recently demonstrated usingplating with an (ECR) copper/tantalum liner i.e. B. Luther et al.Proceedings IEEE VLSI Multilevel Interconnections Conference, SantaClara, California Jun. 8-9, 1993 p.15. The problem with pure copperstuds or vias is that aluminum and copper react at about 250° C. to formAl₂ Cu with a 2.8% volume expansion. A barrier layer placed on top ofthe studs sufficient to prevent a reaction between the copper stud orvia and the aluminum lines or conductors would also decrease theelectromigration lifetime, in a similar manner as a tungsten stud orvia, by preventing aluminum or copper atoms from being transportedthrough the barrier layer in regions with high current density.Additionally, the thickness of the barrier layers on the aluminum linesor conductors would increase the line height or conductor height andhence the interlevel capacitance between adjacent conductors. If thebarrier layer were to fail during subsequent processing, the copper andaluminum would react forming Al₂ CU with the associated volume increaseof 2.8% which would cause delamination at the metal/oxide or insulatorinterface.

In U.S. Pat. No. 5,010,039 which issued on Apr. 23, 1991 to S-M Ku etal., describes methods of forming contacts to a semiconductor devicewhere via holes are etched through a deposited first insulation layer ona semiconductor chip with defined contact areas below, then sputtered,evaporated or CVD deposition of an Al/Cu alloy is performed to fill thevia holes to make a contact stud. The deposited surface may then bechemical-mechanical polished to planarity.

In U.S. Pat. No. 5,071,714 which issued on Dec. 10, 1991 to K. P.Rodbell et al., a multilayered intermetallic connection forsemiconductor devices is described wherein aluminum/copper alloy, lessthat 2% copper, is deposited on a thin layer of Ti, and another layer ofTi is subsequently deposited on top of the AlCu prior to a final caplayer of Al/Cu or Al. The layers are deposited over semiconductorcontact areas and are subsequently annealed to form TiAl₃ layers on boththe top and bottom AlCu surfaces.

In U.S. Pat. No. 4,884,123 which issued on Nov. 28, 1989 to P. Dixit etal. entitled "Contact Plug and Interconnect Employing a Barrier Liningand a Backfilled Conductor Material", via holes are etched through afirst insulator layer on a semiconductor surface over defined contactareas, and then the via interior is flashed with a thin deposit of Ti orTiN, followed by a deposition of Al/Cu, with 1% copper in alloy, to filland form the contact plug. A second patterned metal layer may be formedcontacting the formed Al/Cu contact plugs after planarization.

In U.S. Pat. No. 4,335,506 which issued on Jun. 22, 1982 to G. T. Chiu,a layer of Cu is lift-off deposited onto an Al layer, then the resist isremoved and the exposed Al is etched away using the Cu layer as an etchmask. The remaining Al layer with the Cu layer above is annealed toforman Al/Cu alloy metalization and contacts. The step of annealingcauses the copper to diffuse into, and alloy with the aluminum layer.

SUMMARY OF THE INVENTION

In accordance with the present invention, an interconnect structure foran integrated circuit for resisting electromigration as high currentdensities pass through interlayer contact regions of the interconnectstructure is described comprising a first patterned interconnect layerhaving a first metal selected from the group consisting of copper,copper alloys, aluminum and aluminum alloys formed over a firstinsulation layer and over first electrical contact regions, vias orstuds passing through the first insulation layer, a second insulationlayer formed over the first patterned interconnect layer and the firstinsulation layer, the second insulation layer having openings thereinwith second electrical contact regions, vias or studs therein for makingelectrical contact with the first patterned interconnect layer, and asecond interconnect layer having a second metal selected from the groupconsisting of copper, copper alloys, aluminum and aluminum alloys formedover the second insulation layer and over the second electrical contactregions, vias or studs, the second electrical contact regions, vias orstuds comprising substantially the compound Al₂ Cu in the theta phase.It is understood that if copper or a copper alloy is used as theinterconnect levels then a barrier layer would be required between theAl₂ CU stud and the Cu layers. Otherwise the Al₂ CU will decompose.

The invention further provides a method for forming interconnections onan integrated circuit chip starting with a dielectric surface withcontact regions, vias or studs such as tungsten studs connecting tosilicon devices on the chip comprising the steps of: sputter depositinga layer of titanium followed by a layer of Al-Cu where Cu is about 0.5wt. % of the Al-Cu layer followed by a layer of Ti followed by a layerof TiN to form a first composite metal layer. The composite layer issubsequently patterned into metal lines and annealed at 200° C. for aminimum of 20 minutes (at 360° C.). During this anneal, the Ti reactswith the Al-Cu forming TiAl₃ intermetallic compound along both thebottom and top interfaces of the Al-Cu layer. Next, a first insulatorlayer is formed over and thicker than the first composite metal layerand filling all spaces between metal lines in the pattern of the firstcomposite metal layer to form a generally planarized insulator. AChemical Mechanical Polish (CMP) can also be used to ensure a planarizedinsulator. Next, defining and forming contact holes in the firstinsulator layer down to selected areas on the top of the pattern ofmetal lines formed from the first composite metal layer. In the contactholes, the top TiN and TiAl₃ layers may be removed after forming thecontact holes in the first insulator layer. The holes and removal oflayers may be accomplished or drilled by reactive ion etching (RIE).Next, the contact holes are filled with Cu such as by chemical vapordeposition (CVD), electrolytic plating, ECR deposition or an electrolessCu processes. Next, a Cu-chemical mechanical polish (CMP) is used toplannarize and to remove any Cu from the dielectric layer. Next, formingAl or Al alloy as a blanket film on top of the first insulation layerand covering all of the Cu filled vias or studs with the blanket filmsuch as by sputtering or evaporation. Alternately, this step may bedeleted. Next, annealing the Cu to form Al₂ CU in the vias or studs byreaction with aluminum atoms from the layer above or from the metallines of the first composite layer below. The annealing temperaturetypically may be in the range from 200° C. to 400° C. for a time periodfrom 20 to about 60 minutes. Next, the unreacted Al or Al-Cu may beremoved from the top surface of the first insulator layer such as byusing a wet etch, RIE or CMP. Also, Al₂ CU extending above the contactholes may be removed by CMP. The foregoing steps may be repeated to formadditional levels of interconnection.

The invention further provides metal vias or studs of Al₂ Cu in thetheta phase which has a resistivity of 8 micro-Ohm-cm which is less thanthe resistivity of tungsten studs or vias which have a resistivity inthe range from 10 to 13 micro-Ohm-cm.

The invention further provides metal vias or studs of Al₂ Cu in thetheta phase between patterned metallic layers which serve as a sourceand path for Cu to move to both the upper and lower Al-Cu lines toreduce the susceptibility to electromigration and thermal voiding ascompared to tungsten.

The invention further provides metal vias or studs of Al₂ Cu in thetheta phase which may be uncovered during subsequent etching since Al₂Cu is an excellent etch stop.

BRIEF DESCRIPTION OF THE DRAWING

These and other features, objects, and advantages of the presentinvention will become apparent upon consideration of the followingdetailed description of the invention when read in conjunction with thedrawing in which:

FIG. 1 is one embodiment of the invention.

FIGS. 2 through 6 show steps in forming the embodiment of FIG. 1.

FIG. 7 shows a cross-section view of an interconnect structurefabricated in the laboratory.

FIG. 8 is a binary phase diagram for Al-Cu.

DESCRIPTION OF THE PREFERRED EMBODIMENT

Referring now to the drawing, FIG. 1 shows interconnect structure 10above semiconductor chip 14.

Referring to FIG. 1, interconnect structure 10 is shown for resistingelectromigration as high current densities pass through interlayercontact regions or studs 12 and 13. Interlayer contact region or studs12 and 13 comprises substantially the compound Al₂ Cu in the thetaphase. Interlayer contact regions 12 and 13 may thus allow the transportof copper atoms and aluminum atoms due to very high current densities toand from adjacent wiring layers. As shown in FIG. 1, a semiconductorchip may have a substrate 15 with p and n impurity regions formedtherein and in ohmic contact with contact regions 16 and 17 which maybe, for example, titanium silicide for interconnecting to p and nregions. A layer of insulation 20 may be formed over substrate 15 andmay be silicon dioxide or silicon nitride. Substrate 15 may be asemiconductor such as silicon, silicon germanium alloy, or germanium orsome other semiconductor material. An insulation layer 22, for example,silicon dioxide may be formed over insulation layer 20 and contactregions 16 and 17. Openings may be formed in insulation layer 22 andsubsequently filled with a metalization to make ohmic contact withcontact regions 16 and 17. The metalization may be tungsten whichprovides a barrier to copper atoms. As shown in FIG. 1 contact regions16 and 17 are connected to electrical contact regions or studs 24 and25. Insulation layer 22 may have an upper surface 23 which is alsoco-planar with the upper surface of electrical contact regions 24 and25. The upper surface 23 of insulation layer 22 may be formed bychemical-mechanical polish (CMP) and may be substantially planar.

The integrated circuit chip 14 may now be connected by way of aninterconnect structure 10 formed above upper surface 23. Wherein uppersurface 23 has a plurality of contact regions such as 24 and 25.

A first patterned interconnect layer 30 may be formed on upper surface23 such as by a blanket deposition of a metal selected from the groupconsisting of copper, copper alloys, aluminum and aluminum alloys. Theblanket layer may be photolithographically patterned by way ofphotoresist and etching to form the first patterned interconnect layer30. In the case of copper, damascene patterns would be used. Thethickness of the metal lines or height may be determined by thethickness of the blanket layer of metal and may be in the range from 100nm to 1500 nm. An insulation layer 34 may be formed over first patternedinterconnect layer 30 and over upper surface 23 having a thickness tocover first patterned interconnect layer 30 and may be in the range fromlayer 30 thickness to 3000 nm. Insulation layer 34 is typicallyplanarized and may have a greater thickness than the thickness of firstpatterned interconnect layer 30. Insulation layer 34 may be, forexample, silicon dioxide, silicon nitride, polyimide and diamond-likecarbon. Insulation layer 34 may have openings 36 formed therein toexpose portions of first patterned interconnect layer 30 whereininterconnections are desired. Openings 36 may be formed by reactive ionetching (RIE). The openings are subsequently filled with copper which isplanarized and annealed at a temperature to allow aluminum atoms toreact with the copper to form Al₂ Cu in the theta phase in regions orstuds 12 and 13. The copper may require a thin adhesion layer whichwould be from the group of refractory metals Ti, Ta, TiN, etc. Asacrificial layer of Al or Al alloy would be deposited on top of the Cuto serve as a source of Al to form Al₂ Cu. This can then be removedprior to the deposition of layer 40.

The second patterned interconnect layer 40 is formed over upper surface35 of insulation layer 34 and over interlayer contact regions or studs12 or 13. The second patterned interconnect layer 40 may be formed byfirst forming a blanket deposit of metal selected from the groupconsisting of copper, copper alloys, aluminum and aluminum alloys. Aphotoresist layer may be formed over the blanket layer of metal, exposedand developed. The blanket layer may be etched using the photoresist asa mask. The photo resist may be subsequently removed. The height orthickness of the second pattern interconnect layer 40 may be determinedby the thickness of the blanket layer of metal deposited prior topatterning and may be in the range from 100 to 1500 nm.

While FIG. 1 shows first patterned interconnect layer 30 and secondpattern interconnect layer 40, additional patterned interconnect layersmay be added by repeating the structure shown between first patternedinterconnect layer 30 and second patterned interconnect layer 40.

FIGS. 2 through 6 shows steps in forming the embodiment of FIG. 1. InFIGS. 2 through 6 like references are used for functions correspondingto the apparatus of FIG. 1. Electrical contact region 24 may be tungstenwhich provides a barrier to the diffusion of Al and copper atoms towardssubstrate 15 shown in FIG. 1. First patterned interconnect layer 30 maybe formed by sputter depositing a blanket layer of titanium 46 followedby a layer of aluminum-copper 47 followed by a layer of titanium 48followed by a layer of titanium nitride TiN 49. Layer 49 of titaniumnitride provides an anti-reflection coating useful for preventingreflection of light when first patterned interconnect layer 30 ispatterned. Layers 46 through 49 comprising first patterned interconnectlayer 30 after patterning are annealed at 400° centigrade for a minimumof 20 minutes. During this step of annealing, the titanium layers 46 and48 react with the aluminum in layer 47 forming TiAl₃ in a metalliccompound along both the bottom and top interfaces of layer 47. Layers 46and 48 initially of titanium are reacted to form TiAl₃.

Next, an insulation layer 34 such as silicon dioxide is applied overfirst patterned interconnect layer 30 such as by a PECVD (PlasmaEnhanced Chemical Vapor Deposited) oxide 34 and over first patternedinterconnect layer 30 which results in a planarized insulator havinghigh aspect features filled with oxide in the first patternedinterconnect layer 30. Planarization of insulation layer 34 may beachieved by RIE or by CMP.

Next, openings 36 are drilled or formed in insulation layer 34 down tothe top of first patterned interconnect layer 30. Openings 36 andsubsequent studs 12 and 13 may be in the range from 100 to 2000 nm inheight. In forming openings 36, the alignment of the openings to thefirst patterned interconnect layer 30 may not be perfect as shown inFIG. 2. Further, layer 49 and 48 may be removed during the drilling orforming of opening 36 which may be formed by RIE.

Next, as shown in FIG. 3, opening 36 including the walls and bottom ofopening 36 have a thin adhesion layer 52 of a refractory metal such astantalum formed thereon for adhesion. Next a copper seed layer 53 can beformed over adhesion layer 52 such as by sputtering. Opening 36 may becompletely filled by electroless or electrolytic plating copper usingcopper seed layer 53 as an electrode during the electrolytic platingprocess. Alternately, in place of copper seed layer 53, opening 36 maybe filled with copper completely by bias sputtering, hot evaporation,CVD, etc.

Next, as shown in FIG. 4, adhesion layer 52, copper seed 53 and copper54 is removed from upper surface 35 such as by chemical mechanicalpolish.

Next, as shown in FIG. 5, copper 54 in opening 36 may be annealed at atemperature in the range from 200° centigrade to 548° centigrade to formAl₂ Cu in the theta phase. The aluminum atoms are supplied by diffusingfrom layer 47 through the adhesion layer 52, copper seed layer 53 andcopper layer 54. Since Al₂ Cu has a 2.8 percent volume expansion withrespect to Cu alone, the material in opening 46 will extrude upwards andform a mushroom above upper surface 35 which may be subsequently removedby a brief chemical-mechanical polish.

In an alternate method, prior to annealing copper 54, a blanket layer 58may be formed on upper surface 35 and on the upper surface 55 of copper54 shown in FIG. 6. Blanket layer 58 may be formed by sputtering or byevaporation. The material in opening 36 namely copper 54 may beconverted to Al₂ Cu in the theta phase by annealing in the range from200° C. to 548° C. for 60 minutes (at 400° C.). Blanket layer 58 as wellas layer 47 will provide aluminum atoms by way of diffusion into copper54 thereby enabling Al₂ Cu to be formed in place of copper 54 and copperseed layer 53, if present. At the same time copper atoms from copper 54will diffuse into blanket layer 58 and layer 47. Next, the unreactedAl-Cu or Al on upper surface 35 and above opening 36 is removed using awet etch, RIE or chemical-mechanical polish or combinations thereof.This method would be required if layer 47 was copper.

The resulting structure from the process steps shown in FIGS. 2-6 isinterlevel contact regions or studs 12 and 13 shown in FIG. 1 whichcomprise Al₂ Cu. Interlayer contact regions or studs 12 and 13 comprisedof Al₂ Cu are in the theta phase and would have a resistivity of 8micro-Ohm-cm which is less than that of tungsten vias which would have aresistivity in the range from 10 to 13 micro-Ohm-cm. Since the Al₂ Custuds are formed reactively they also have a lower contact resistancethan the W studs.

Next, as shown in FIG. 1, a second patterned interconnect layer 40 maybe formed comprising first depositing a thin titanium layer 66 foradhesion, depositing an aluminum-copper layer 67, depositing thereover atitanium layer 68 followed by a titanium nitride layer 69 whichfunctions as an anti-reflection coating. The blanket layers 66 through69 may be patterned by applying and developing photoresist to form amask and etching through the mask.

Layers 66 through 69 may be formed by the same processes and to the samethicknesses as layers 46 through 49. Additional levels of metallizationmay be added by repeating the steps described herein starting with thestep of forming an insulation layer 34 (which may be the same as layer34 described previously) over second patterned interconnect layer 40.

FIG. 7 shows a cross section view of an interconnect structurefabricated in the laboratory taken with a scanning electron microscope(SEM). In FIG. 7 like references are used for functions corresponding tothe apparatus of FIGS. 1 through 6. The width or diameter of interlayercontact region 12 is about one micron wide as shown by arrow 74. Thecross section view was taken after forming Al₂ Cu (12) by annealling Cuin contact with an Al line (47) and blanket Al film 58. First patternedinterconnect layer 30 shows a TiN layer 49 on either side of interlayercontact region 12 on the top surface of layer 30. FIG. 7 showsinterlayer contact region 12 of Al₂ Cu and that some Cu diffused intolayers 30 and 40 to form Al₂ Cu precipitates 76 and 78 below and aboveregion 12. A second precipitate 80 and 82 in layers 30 and 40 to theright of region 12 were formed with respect to another contact region ofAl₂ Cu out of view to the right of contact region 12. Layer 30 wascomprised of Al-Cu where Cu was 0.5% weight. Insulation layer 34 wassilicon dioxide. FIG. 7 shows the Al₂ Cu formation prior to removal ofthe top sacrificial Al (or AlCu) layer. Additionally there appears to besome damage to the lower interface during SEM sample preparation.

It was disclosed by Q. Z. Hong and F. M. d'Heurle, at the MaterialsResearch Symposium 1992 Fall Meeting, that Cu is a dominant diffusingspecies in Al₂ Cu formation and that the reaction is a function oftemperature. At 200° centigrade the ratio of Cu/Al moving species is 3to 1 whereas at 400° centigrade the ratio of Cu/Al moving species iscloser to 1 to 1. Therefore, it is possible to choose an annealingtemperature which balances the mass flux to avoid void formation yetallows for the reaction in opening 36 to proceed to completion. Further,it is noted that the theta-phase-studs 12 and 13 will be in equilibriumwith layers 47 and 67 of Al-Cu where Cu may be 2 percent weight andtherefore may dissolve with additional annealing cycles to satisfy theAl layers 47 and 67 solubility. This has been beneficial since thetheta-phase-studs 12 and 13 will then serve as a Cu source for the Al-Culayers 47 and 67. Layers 47 and 67 would thus be less susceptible toelectromigration and less sensitive to thermal voiding than, forexample, if the studs 12, 13 were tungsten which provides a barrier tocopper and Al. The lower susceptibility is due to Cu and Al being ableto diffuse through Al₂ Cu whereas W is impermeable to Cu and Al atnormal operating and processing temperatures.

Additionally, during processing, interlayer contact regions 12 and 13 ofAl₂ Cu may be uncovered since Al₂ Cu is difficult to etch (wet etch orRIE). Thus, the presence of Al₂ Cu studs 12 and 13 would be veryadvantageous during the Al-Cu RIE of the second patterned interconnectlayer 40 since studs 12 and 13 may be exposed or uncovered. Al₂ Cu isalso much more difficult to etch (wet etch or RIE) than Al so studremoval during the etching of second patterned interconnect layer 40 orduring over-etch would be greatly reduced.

FIG. 8 is a binary phase diagram for Al-Cu showing that Al₂ Cu in thetheta phase forms when Cu is annealed in an Al rich environment. In FIG.8, the theta phase is shown to be bounded by lines 86-88 and to occur inthe range from 53% to 54% weight Cu. Al₂ Cu in the theta phase is stableup to 590° C. At the eutectic temperature of 548.2° C., the compositionrange is in the range from 31.9 to 32.9 atomic percent Cu. For furtherinformation about Al₂ Cu in the theta phase, reference is made to T. B.Massalski, Binary Alloy Phase Diagrams, published by American SocietyFor Metals, Metals Park, Ohio 44073 (1986) pages 106 and 107 which areincorporated herein by reference.

While there has been described and illustrated an interconnect structureformed on an integrated circuit chip for resisting electromigration byproviding interlayer contact regions of Al₂ Cu in the theta phasebetween patterned interconnect layers of Al-Cu or Al, it would beapparent to those skilled in the art that modifications and variationsare possible without deviating from the broad scope of the inventionwhich shall be limited solely by the scope of the claims appendedhereto.

Having thus described our invention, what we claim as new and desire to secure by Letters Patent is:
 1. An interconnect structure for an integrated circuit chip for resisting electromigration as high current densities pass through interlayer contact regions of said interconnect structure comprising:a first patterned interconnect layer including a first metal selected from the group consisting of copper, copper alloys, aluminum and aluminum alloys formed over a first insulation layer and over first electrical contact regions passing through said first insulation layer, a second insulation layer formed over said first patterned interconnect layer and said first insulation layer, said second insulation layer having openings therein with second electrical contact, regions therein for making electrical contact with said first patterned interconnect layer, and a second patterned interconnect layer including a second metal selected from the group consisting of copper, copper alloys, aluminum and aluminum alloys formed over said second insulation layer and over said second electrical contact regions, said second electrical contact regions comprising substantially the compound Al₂ Cu in the theta phase, wherein said first patterned interconnect layer further includes a lower layer of TiAl₃.
 2. The interconnect structure for an integrated circuit chip for resisting electromigration as high current densities pass through interlayer contact regions of said interconnect structure comprising:a first patterned interconnect layer including a first metal selected from the group consisting of copper, copper .alloys, aluminum and aluminum alloys formed over a first insulation layer and over first electrical contact regions passing through said first insulation layer, a second,insulation layer formed over said first patterned interconnect layer and said first insulation layer, said second insulation layer having openings therein with second electrical contact regions therein for making electrical contact with said first patterned interconnect layer, and a second patterned interconnect layer including a second metal selected from the group consisting of copper, copper alloys, aluminum and aluminum alloys formed over said second insulation layer and over said second electrical contact regions, said second electrical contact regions comprising substantially the compound Al₂ Cu in the theta phase, wherein said first patterned interconnect layer further includes a top layer of TiAl₃.
 3. The interconnect structure for an integrated circuit chip for resisting electromigration as high current densities pass through interlayer contact regions of said interconnect structure comprising:a first patterned interconnect layer including a first metal selected from the group consisting of copper, copper alloys, aluminum and aluminum alloys formed over a first insulation layer and over first electrical contact regions passing through said first insulation layer, a second insulation layer formed over said first patterned interconnect layer and said first insulation layer, said second insulation layer having openings therein with second electrical contact regions therein for making electrical contact with said first patterned interconnect layer, and a second patterned interconnect layer including a second metal selected from the group consisting of copper, copper alloys, aluminum and aluminum alloys formed over said second insulation layer and over said second electrical contact regions, said second electrical contact regions comprising substantially the compound Al₂ Cu in the theta phase, wherein said second patterned interconnect layer further includes a bottom layer of TiAl₃. 